Multivariate Curve Resolution (MCR) techniques constitute a versatile family of chemometric methods designed to decompose complex data matrices into a bilinear model comprising pure component ...

Understanding how structural defects affect the optoelectronic performance of silicon semiconductor wafers is critical for improving device efficiency and reliability. Simultaneous Raman and ...

Chase Cañas, a Ph.D. student in the Chester F. Carlson Center for Imaging Science, presented “Multivariate methods to explore system sensitivities for hyperspectral subpixel target detection” at the ...